AOI Solutions
Matfron's AOl inspection technology is primarily applied in the semiconductor packaging field, providing customers with high-precision and efficient solutions for defect inspection and optical measurement.
2D Measurement
Meticulous Inspection, Detecting Various Image Defects
Detection Capability
· Lead: missing, broken, collapsed, bond offset, non-sticky, abnormal foot, lifted, repeated
· Laser Chip: missing, polarity error, offset, printing, silver paste coverage, contamination
· Encapsulation: overflow, unfilled, misalignment, wire leakage
· Laser Mark: printing, size, font, alignment, spacing
· Surface Mount Components: position, missing, polarity error, skewed, tombstone
· FQC (Final Quality Control): adhesive overflow, misprinting, blurry printing, pin deformation, foreign object contamination, colloid rupture
· Solder Joint: 1/2 solder joint defect, solder joint deviation
Online Service
Welcome to contact us for more information.
SUPPORT:
TelL：021-66249122 E-mail：service@matfron.com Address: 9F, No.28, Jiang Chang San Road, Jingan, Shanghai
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